• Tapping/ Non Contact Mode Atomic Force Microscopy

• Contact Mode Atomic Force Microscopy

• Conductive Atomic Force Microscopy (CAFM)

• Electrostatic Force Microscopy (EFM)

• Kelvin Probe Force Microscopy (KPFM)

• Piezoresponse/Piezoforce Microscopy (PFM)

• Scanning Capacitance Microscopy (SCM)

• Scanning Microwave Microscopy (SMM)

• Scanning Microwave Impedance Microscopy (SMIM)

• Scanning Nearfield Optical Microscopy (SNOM)

• NanoIR and THZ applications

RMN probes have been featured in many publications. View publications here.

RMN manufactures ultra-sharp solid metallic scanning probes

• Standard Tip Radius of 20nm

• Variable Tip Radius from 10nm to 1 um on request

• Solid probes have no metal adhesion problems

• Cantilever frequencies from 4.5kHz to 105kHz

• Standard cantilever lengths of 200µm, 300µm or 400µm

• Standard tip shank length of 80µm

• FE-SEM image of each probe available

• Non-standard cantilever length, tip shank length, and tip radius can be manufactured upon request

RMN provides consulting on nanometer scale physical characterization by Scanning Probe Microscopy (AFM, SCM, C-AFM, EFM, etc.)